Recently, the research team of Xi Peng, a specially-appointed researcher at the School of Engineering, Peking University, combined with the research group of Professor Wen-Di Li of the University of Hong Kong, the research group of Huan-Cheng Chang of Taiwan, and Dr. Huang Lei of Tsinghua University, respectively, use stimulated radiation photoquenching technology (STED) With the structured light illumination super-resolution technology (SIM), the micro-imaging contrast of NV center's ultra-optical limit resolution is realized.
Stimulated radiation light quenching technology (STED) and structured light illumination super-resolution technology (SIM), as two types of ultra-optical limit resolution microscopy technology, have been widely used in the field of life sciences. In the past, the characteristics of the two super-resolution microscopy techniques have not been compared on the same sample. Using the characteristics of NV center's non-photobleaching, the author conducted an in-depth and comprehensive comparison study on the resolution and other parameters of these two super-resolution microscopy techniques. Using 35nm NV center nano-diamond particles and NV center lattice on large diamonds, the two methods were compared and imaged. STED has a higher resolution, but SIM has a larger field of view. Related results were published in the RSC Advances journal of the Royal Chemical Society Publishing Group.
Yang Xusan, a graduate student in Xi Peng's research group, is the first author of this article, and Xi Peng is the corresponding author of this article. The research areas of Xi Peng's research group include super-diffraction limit resolution micro-imaging, laser confocal scanning micro-imaging, multi-photon micro-imaging and optical coherence tomography.
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